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TTTC’s E.J. McCluskey |
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Since 2005, the TTTC Best Doctoral Thesis Award in test technology has been presented annually to the winner of a contest, which took place at the IEEE VLSI Test Symposium. The Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology.In order to increase the worldwide participation of doctoral students, starting in 2010, the contest was expanded to a two-stage process. Semi-finals will be held at TTTC-sponsored conferences, symposia or workshops. The winners of the semi-finals, determined by jurys composed of industrial experts, will compete against each other in the finals, held at a major TTTC-sponsored conference or symposium. This major Award has recentlybeen named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability. |
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The Doctoral Student Contest
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Eligibility
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| ATS Semi-Final | |
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| Additional Information | |
TTTC: http://tab.computer.org/tttc/ ->Awards->Doctoral Thesis ATS’11: http://www.ecs.umass.edu/ece/ats11/ Organizer: Huawei Li, lihuawei@ict.ac.cn |
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| Past Recipients | |
2010 Finals (held at IEEE International Test Conference) Second place winner: Hsiu-Ming (Sherman) Chang, University of California, Santa Barbara, USA Third place winner: Alex Roschildt Pinto, Universidade Federal de Santa Catarina, Brazil 2009 (held at IEEE VLSI Test Symposium) First place winner: Mahmut Yilmaz, Duke University Second place winner: Erkan Acar, Duke University Third place winner: Bo Yang, Polytechnic Institute of NYU 2008 (held at IEEE VLSI Test Symposium) First place winner: Devanathan Varadarajan, Indian Institute of Technology, Madras, India Second place winner: Sudarshan Bahukudumbi, Duke University, USA Third place winner: Francois-Fabien Ferhani, Stanford University, USA 2007 (held at IEEE VLSI Test Symposium) First place winner: Nisar Ahmed, University of Connecticut, USA Second place winner: Nikola Bombieri, University of Verona, Italy Third place winner: Ahcene Bounceur, TIMA Laboratory, Grenoble, France 2006 (held at IEEE VLSI Test Symposium) First place winner: Federico di Palma, University of Pavia, Italy Second place winner: Achraf Dhayni, TIMA Laboratory, Grenoble, France Third place winner: Paolo Bernardi, Politecnico di Torino, Italy 2005 (held at IEEE VLSI Test Symposium) First place winner: Alberto Valdes-Garcia Second place winner: Anand Gopalan Third place co-winner: Swarup Bhunia Third place co-winner: Haralampos Stratigopoulos |
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more information, email Huawei Li at: TTTC Student Activities Group |
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| The Doctoral Thesis Award is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council Student Activities Group (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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